Episode 1858
Scanning voltage microscopy
Sun, 2022-Jun-05 01:05 UTC
Length - 1:33
Direct Link
Welcome to random Wiki of the Day where we read the summary of a random Wikipedia page every day.
The random article for Sunday, 5 June 2022 is Scanning voltage microscopy.
Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or optoelectronic sample. By connecting the probe to a high-impedance voltmeter and rastering over the sample's surface, a map of the electric potential can be acquired. SVM is generally nondestructive to the sample although some damage may occur to the sample or the probe if the pressure required to maintain good electrical contact is too high. If the input impedance of the voltmeter is sufficiently large, the SVM probe should not perturb the operation of the operational sample.
This recording reflects the Wikipedia text as of 01:05 UTC on Sunday, 5 June 2022.
For the full current version of the article, see Scanning voltage microscopy on Wikipedia.
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This has been Matthew Neural. Thank you for listening to random Wiki of the Day.
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